Oxford Instruments (LON:OXIG) released its quarterly earnings results on Tuesday. The company reported GBX 56.30 ($0.75) earnings per share (EPS) for the quarter, topping the Zacks’ consensus estimate of GBX 54.20 ($0.72) by GBX 2.10 ($0.03), Bloomberg Earnings reports. Oxford Instruments had a return on equity of 13.16% and a net margin of 7.57%.
Shares of Oxford Instruments traded up GBX 34 ($0.45), reaching GBX 1,050 ($13.98), during mid-day trading on Thursday, according to MarketBeat. 117,356 shares of the company’s stock were exchanged, compared to its average volume of 49,802. Oxford Instruments has a 52-week low of GBX 680 ($9.05) and a 52-week high of GBX 1,174 ($15.63).
The business also recently declared a dividend, which will be paid on Friday, October 19th. Stockholders of record on Thursday, September 13th will be given a dividend of GBX 9.60 ($0.13) per share. This represents a dividend yield of 0.96%. This is an increase from Oxford Instruments’s previous dividend of $3.70. The ex-dividend date is Thursday, September 13th.
In other news, insider Gavin Hill purchased 235 shares of Oxford Instruments stock in a transaction that occurred on Friday, April 6th. The shares were bought at an average cost of GBX 763 ($10.16) per share, with a total value of £1,793.05 ($2,387.23). Insiders have bought 268 shares of company stock worth $209,717 over the last three months.
Oxford Instruments Company Profile
Oxford Instruments plc, through its subsidiaries, researches, develops, manufactures, rents, sells, and services tools and systems in the United States, rest of Europe, rest of Asia, the United Kingdom, Japan, China, Germany, and internationally. The company's Nanotechnology Tools segment provides high performance scientific imaging cameras, spectroscopy solutions, and microscopy systems for research and OEM markets; atomic force probe microscopy for materials and bioscience applications; 3D and 4D image visualization and analysis software; and nanoanalysis solutions for materials characterization and nanofabrication on scanning electron microscopes, focussed ion beams, and transmission electron microscopes.
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